Researchers from RWTH Aachen University and the Graphene Flagship Standardization Committee have pushed through a new IEC standard for assessing the strain uniformity of single-layer graphene using Raman spectroscopy.
Research has shown that the electrical and the structural quality of graphene are intimately connected, and that nanoscale lattice deformations caused by surface corrugations limit the mobility of electrons in graphene. Therefore, controlling the flatness of a graphene sheet is fundamental for the fabrication of high-quality graphene layers for electronic devices – and the possibility of measuring this parameter with a simple and fast method is a major technological advantage. Furthermore, the new standard for detecting graphene flatness, pioneered by the Graphene Flagship and published by the International Electrotechnical Commission (IEC), could expedite the manufacture and implementation of single-layer graphene.